Performance and degradation of commercial UV‐C LEDs for disinfection purposes

We report on the reliability of commercial UV-C (UltraViolet-C) LEDs (Light Emitting Diodes) subjected to constant current stress. Electrical, optical and spectral analysis was carried out with an emission peak 275 nm a nominal power 12 mW at 100 mA. Degradation tests were maximum rated current, double three times maximum. The LED lifetime found be inversely proportional third stress density, indicating that degradation mechanism might activated by high energy electrons arising from Auger-Meitner recombination. Electrical characterization indicates increase in defect-related leakage, whereas identifies variation two peaks which can ascribed defect density active region p-GaN (Gallium Nitride) layer LEDs. A final remark comes strong dependence operating current: increasing lower number system is not optimized strategy. In fact, this has substantial impact lifetime, thus lowering total permitted disinfections. This article protected copyright. All rights reserved.